Our products

Particle size analyzer VASCO FLEX™

The VASCO FLEX™ is a unique and fully agile nanoparticle size analyzer combining the power of Dynamic Light Scattering (DLS) and the flexibility of optical fibers. With its four plug & play in situ measurement head options, the VASCO FLEX fits to a large range of situations and suspensions.

Size range

0.5 nm to 10 µm

Concentration range

0.0001% to 40% (%vol)

Particle size analyzer VASCO™

The VASCO™ nanoparticle size analyzer is a unique instrument for nanoparticle suspension and colloidal characterization, based on the Dynamic Light Scattering (DLS). It uses a patented system allowing measurement of diluted sample as well as dark / concentrated ones, without dilution.

Size range

0.5 nm to 10 µm

Concentration range

0.0001% to 40% (%vol)

Zeta potential analyzer WALLIS™

The WALLIS™ is an innovative high resolution Zeta potential analyzer purely dedicated to nanoparticle and colloidal charge characterization. Based on a modern version of Laser Doppler Electrophoresis (LDE) technique, it is the ideal tool for studying colloidal suspension’s stability and nanoparticles’ electrophoretic properties.

Zeta potential range

– 500 mV to 500 mV

Concentration range

0.0001% to 10% (w/%)

NP traces analyzer MAGELLAN™

The MAGELLAN™ is a unique instrument for the measurement (size distribution and concentration) of nanoparticle traces in water, based on Laser Induced Breakdown Detection (LIBD) technique, which offers accurate data analyses.

Size range

10 nm to 1000 nm

Concentration range

104 to 1011 part/mL

Glow discharge system ELMO™

The ELMO™ is a Glow Discharge System allowing you to modify the surface properties (hydrophilic or hydrophobic / positively or negatively charged) of TEM support films or grids in order to optimize the adsorption of the solutions to spread.

Plasma current

0 to 30 mA

Process time

< 1 min

Benchtop TEM microscope LVEM 5 from Delong Corp.

The LVEM 5 is a unique investigative tool, which combines transmission (TEM, STEM) and surface scanning (SEM) observation modes. High contrast on light elements without using heavy metal staining and shadowing comes from a low accelerating voltage (5 kV). It offers a high throughput benchtop solution with nanometer resolutions.

Resolution (TEM mode)

2.5 nm

Total magnification (TEM mode)

1,500 to 202,000x

Electron microscope LVEM 25 from Delong Corp.

The LVEM 25 is a unique investigative tool, which combines transmission TEM and STEM observation modes. Substantially lower accelerating voltages (ranging from 25 kV to 10 kV) than conventional TEM (typically 80–200 kV) provide substantially improved contrast on light elements with conventionally prepared samples.

Resolution (TEM mode)

1.0 nm

Total magnification (TEM mode)

3,400 to 1,300,000x

VASCO KIN

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