Particle size and Zeta potential analyzer AMERIGO™
The AMERIGO™ is an innovative analyzer for the characterization of nanoparticle suspensions combining into the same instrument particle size and Zeta Potential measurements.
Particle size analyzer VASCO KIN™
The VASCO KIN™ is a unique and fully agile nanoparticle size analyzer combining high resolution Time-resolved Dynamic Light Scattering technology (TR-DLS) and unique in situ remote optical probe for contactless experiments and process kinetics monitoring.
Particle size analyzer VASCO™
The VASCO™ nanoparticle size analyzer is a unique instrument for nanoparticle suspension and colloidal characterization, based on the Dynamic Light Scattering (DLS). It uses a patented system allowing measurement of diluted sample as well as dark / concentrated ones, without dilution.
Zeta potential analyzer WALLIS™
The WALLIS™ is an innovative high resolution Zeta potential analyzer purely dedicated to nanoparticle and colloidal charge characterization. Based on a modern version of Laser Doppler Electrophoresis (LDE) technique, it is the ideal tool for studying colloidal suspension’s stability and nanoparticles’ electrophoretic properties.
Glow discharge system ELMO™
The ELMO™ is a Glow Discharge System allowing you to modify the surface properties (hydrophilic or hydrophobic / positively or negatively charged) of TEM support films or grids in order to optimize the adsorption of the solutions to spread.
Electron microscope LVEM 25 from Delong Corp.
The LVEM 25 is a unique investigative tool, which combines transmission TEM and STEM observation modes. Substantially lower accelerating voltages (ranging from 25 kV to 10 kV) than conventional TEM (typically 80–200 kV) provide substantially improved contrast on light elements with conventionally prepared samples.
Benchtop TEM microscope LVEM 5 from Delong Corp.
The LVEM 5 is a unique investigative tool, which combines transmission (TEM, STEM) and surface scanning (SEM) observation modes. High contrast on light elements without using heavy metal staining and shadowing comes from a low accelerating voltage (5 kV). It offers a high throughput benchtop solution with nanometer resolutions.